William A. Hall
1862 - Yes, date unknown-
Name William A. Hall [1, 2] Birth 1862 Indiana, United States [1, 2] Gender Male Residence 26 Jul 1870 Carthage, Rush, Indiana, United States [1] Residence 1 Jun 1880 Washington Township, Rush, Indiana, United States [2] Death Yes, date unknown Person ID I23832 McKelleb Last Modified 7 Nov 2022
Father William S. Hall, b. 8 Mar 1814, Butler County, Ohio, United States d. 21 May 1905, Washington Township, Rush, Indiana, United States (Age 91 years) Mother Malinda Hatfield, b. 15 Mar 1826, Ohio, United States d. 7 Jul 1887, Indiana, United States (Age 61 years) Marriage 26 Jun 1860 Rush County, Indiana, United States [3] Family ID F7152 Group Sheet | Family Chart
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Event Map Birth - 1862 - Indiana, United States Residence - 26 Jul 1870 - Carthage, Rush, Indiana, United States Residence - 1 Jun 1880 - Washington Township, Rush, Indiana, United States = Link to Google Earth
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Sources - [S890] Indiana, Rush, 1870 U.S. Census, Rush County, Indiana, (www.ancestry.com: National Archives and Records Administration, 2009), 6 Nov 2022, M593, roll 356, Washington Township, p. 3, dwelling 22, family 22, William A Hall, Line #32, accessed 07 Nov 2022 (Reliability: 2).
- [S891] Indiana, Rush, 1880 U.S. Census, Rush County, Indiana, (www.ancestry.com: National Archives and Records Administration, 2010), 7 Nov 2022, T9, roll 308, Washington Township, enumeration district (ED) 79, p. 1, dwelling 4, family 4, William A Hall, Line #26, accessed 07 Nov 2022 (Reliability: 2).
- [S881] Indiana. Rush, Family Search, Indiana Marriages, 1811 - 2019, Rush County, Indiana, (www.familysearch.org :2016.), 6 Nov 2022, Indiana Marriages, 1811 - 2019." marriage certificate no. Page #446, Entry #1 (1860), Hall-Knotts, accessed 06 Nov 2022. (Reliability: 4).
- [S890] Indiana, Rush, 1870 U.S. Census, Rush County, Indiana, (www.ancestry.com: National Archives and Records Administration, 2009), 6 Nov 2022, M593, roll 356, Washington Township, p. 3, dwelling 22, family 22, William A Hall, Line #32, accessed 07 Nov 2022 (Reliability: 2).